发明名称 |
SEMICONDUCTOR DEVICE FABRICATING PROCESS |
摘要 |
PURPOSE: To provide a semiconductor device fabricating process capable of forming more minute circuit patterns and fabricating a high-density device by using a lithography technique. CONSTITUTION: In circuit patterns with minute patterns and minute spaces, a hard mask layer is patterned by using first patterns obtained by merging the minute spaces and then the hard mask layer is shrunk. Next, the hard mask layer is patterned by using second patterns obtained based on the minute spaces and finally an underlaying layer is formed with the circuit patterns by using the hard mask layer as a mask.
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申请公布号 |
KR20040024430(A) |
申请公布日期 |
2004.03.20 |
申请号 |
KR20030007686 |
申请日期 |
2003.02.07 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
OKAGAWA TAKASHI;YAMADA TETSUYA;UENO ATSUSHI;YAMAGUCHI ATSUMI;TSUJITA KOUICHIROU |
分类号 |
G03F7/40;G03F7/00;G06F17/50;H01L21/027;H01L21/033;H01L21/28;H01L21/31;H01L21/3213;(IPC1-7):H01L21/027 |
主分类号 |
G03F7/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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