| 发明名称 |
Temperature measurement of an electronic device |
| 摘要 |
The temperature of an electronic device at specified locations is determined by measuring the phonon frequency shift at the location of interest caused by operation of the device.
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| 申请公布号 |
US2004052296(A1) |
申请公布日期 |
2004.03.18 |
| 申请号 |
US20020242430 |
申请日期 |
2002.09.13 |
| 申请人 |
KUBALL MARTIN HERMANN HANS;HAYES JONATHAN MICHAEL |
发明人 |
KUBALL MARTIN HERMANN HANS;HAYES JONATHAN MICHAEL |
| 分类号 |
G01J3/44;G01J5/52;(IPC1-7):G01J5/00;G01K1/16 |
主分类号 |
G01J3/44 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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