发明名称 Method for producing silicon wafer and silicon wafer
摘要 Silicon wafer W is thermal-annealed in atmosphere G to form new vacancies therein in a thermal annealing step and atmosphere G in the thermal annealing step contains a nitride gas having a lower decomposition temperature than a decomposable temperature of N2 so that the thermal annealing is carried out at a lower temperature or for a short time to suppress generation of slip and to provide satisfactory surface roughness.
申请公布号 US2004053516(A1) 申请公布日期 2004.03.18
申请号 US20030432861 申请日期 2003.05.28
申请人 NAKADA YOSHINOBU;SHIRAKI HIROYUKA 发明人 NAKADA YOSHINOBU;SHIRAKI HIROYUKA
分类号 H01L21/322;H01L21/324;(IPC1-7):H01L21/31;H01L21/469;H01L21/26;H01L21/42;H01L21/477 主分类号 H01L21/322
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