发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing semiconductor devices to form IPO capacitors, bipolar transistors and CMOSFETs on a substrate, in which a thermal oxide film of the polycrystal silicon film as a lower side electrode is formed as an insulating layer of the IPO capacitor to reduce the number of manufacturing processes. SOLUTION: A gate oxide film 12 of the CMOSFET is formed, a base 17 of the bipolar transistor is formed, and the polycrystal silicon film 41 is formed on the silicon substrate 1 where an emitter region of the base 17 is exposed. A thermal oxide film 61 is formed on the surface by a heat treatment after addition of an impurity to this polycrystal silicon film 41, and an emitter 62 is formed by diffusing the impurity to the emitter region. An emitter electrode of the bipolar transistor, a lower electrode of the capacitor, and a gate electrode of the CMOSFET are simultaneously formed from the polycrystal silicon film 41 after the heat treatment. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004087719(A) 申请公布日期 2004.03.18
申请号 JP20020245716 申请日期 2002.08.26
申请人 ASAHI KASEI MICROSYSTEMS KK 发明人 MOCHIZUKI HIDENORI;TOITA MASATO
分类号 H01L21/331;H01L21/822;H01L27/04;H01L29/732;(IPC1-7):H01L21/822 主分类号 H01L21/331
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