发明名称 Attenuated embedded phase shift photomask blanks
摘要 An attenuating embedded phase shift photomask blank that produces a phase shift of the transmitted light is formed with an optically translucent film made of metal, silicon, nitrogen or metal, silicon, nitrogen and oxygen. A wide range of optical transmission (0.001% up to 20% at 193 nm) is obtained by this process. A post deposition process is implemented to obtain the desired properties (stability of optical properties with respect to laser irradiation and acid treatment) for use in industry. A special fabrication process for the sputter target is implemented to lower the defects of the film.
申请公布号 US2004053026(A1) 申请公布日期 2004.03.18
申请号 US20030657665 申请日期 2003.09.08
申请人 ANGELOPOULOS MARIE;BABICH KATHERINA E.;BROOKS CAMERON JAMES;CHEY S. JAY;GUARNIERI C. RICHARD;HIBBS MICHAEL STRAIGHT;RACETTE KENNETH CHRISTOPHER 发明人 ANGELOPOULOS MARIE;BABICH KATHERINA E.;BROOKS CAMERON JAMES;CHEY S. JAY;GUARNIERI C. RICHARD;HIBBS MICHAEL STRAIGHT;RACETTE KENNETH CHRISTOPHER
分类号 C23C14/06;C23C14/35;G03F1/00;G03F1/08;G03F7/16;(IPC1-7):B32B1/00;B32B9/00;B32B17/06;B32B15/00;B32B9/04;G02B5/08;G02B5/20;F21V9/04;F21V9/06;C23C14/34;C23C14/08;H05H1/00;H05H1/24 主分类号 C23C14/06
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