发明名称 Method and system for determining sample preparation parameters
摘要 A system and a method for determining sample preparation parameters for use in the preparation of metallographic samples with suitable sample preparation equipment; the system comprises first input means (4a) for inputting input values for a set of preparation criteria; first storage means (2, 6) adapted to store a plurality of preparation criteria and a plurality of sample preparation method parameters; processing means (3) adapted to calculate a set of sample preparation method parameters based on the input values and the stored sample preparation method parameters; output means (4a) for the output of the calculated set of sample preparation method parameters; second input means (4b) for receiving adapted sample preparation method parameters; and second storage means (2) adapted to store the adapted sample preparation method parameters for subsequent retrieval by the processing means in connection with a subsequent determination of sample preparation method parameters requested by an authorised operator.
申请公布号 US2004054684(A1) 申请公布日期 2004.03.18
申请号 US20030416012 申请日期 2003.05.07
申请人 GEELS KAY 发明人 GEELS KAY
分类号 G01N1/00;G01N1/28;G01N1/32;(IPC1-7):G06F17/00 主分类号 G01N1/00
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