发明名称 TEMPERATURE DETECTOR OF SOLID-STATE-IMAGE PICKUP ELEMENT AND METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a temperature detector in which the temperature of a solid-state-image pickup element can be accurately detected, and to provide a method, and also to provide a temperature control device in which cooling efficiency is improved by feedback-controlling a temperature of a solid-state-image pickup element on the basis of the detected temperature of the solid-state-image pickup element, and a method. SOLUTION: In view of the fact that a potential difference between a base and an emitter of a transistor 24 has the temperature dependency, the potential difference between the base and the emitter of the transistor 24 mounted on the solid-state-image pickup element 21 is detected via external terminals which are respectively short-circuited, and temperature information is generated according to the detected potential difference. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004088353(A) 申请公布日期 2004.03.18
申请号 JP20020245616 申请日期 2002.08.26
申请人 SONY CORP 发明人 NAKAJIMA TAKATSUGU
分类号 H01L27/14;H04N5/232;H04N5/335;H04N5/353;H04N5/361;H04N5/372;(IPC1-7):H04N5/335 主分类号 H01L27/14
代理机构 代理人
主权项
地址
您可能感兴趣的专利