发明名称 FINE GRATING AND MANUFACTURING METHOD THEREFOR
摘要 <P>PROBLEM TO BE SOLVED: To provide a fine grating suitable as an antireflection structure and a manufacturing method therefor. <P>SOLUTION: When fine conical or pyramidal projections are arrayed two-dimensionally on a substrate, the arrangement period is varied with a fundamental period as the center or the height of the projections is varied, so that the influence of diffraction of light can be reduced to form an ideal antireflection structure. In order to write patterns having the arrangement period varied, periodic pattern data are used to form patterns having the period varied by superposing a minute variation signal on the deflector of an electron beam exposure device. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004085831(A) 申请公布日期 2004.03.18
申请号 JP20020245843 申请日期 2002.08.26
申请人 NTT ADVANCED TECHNOLOGY CORP 发明人 KURIHARA KENJI;SHIBAYAMA AKINORI
分类号 G03F7/20;G02B1/11 主分类号 G03F7/20
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