发明名称 METHOD FOR MEASURING ELEVATION USING GEOMETRIC CHARACTERISTIC OF INTERFEROMETRIC SYNTHETIC APERTURE RADAR
摘要 PURPOSE: A method for measuring an elevation using a geometric characteristic of an interferometric synthetic aperture radar is provided to measure accurately an elevation by performing a phase difference-elevation conversion process. CONSTITUTION: An SAR image process for generating two-dimensional images is performed by receiving predetermined signals from each antenna by pixel unit having sizes and phases. The SAR images are arranged in a range/Doppler region and an interferometric phase difference is detected by pixel unit. An elevation is obtained by performing a phase difference-elevation conversion process and using a predetermined mathematical expression. A filtering for processing the calculated elevation information is performed by processing of one pixel or a spatial filtering process using a multi look method for dividing one region into multiple pixels.
申请公布号 KR100425283(B1) 申请公布日期 2004.03.18
申请号 KR20030024546 申请日期 2003.04.18
申请人 CHUNGCHEONG SURVEY & DESIGN. CO., LTD. 发明人 LEE, JAE KWAN
分类号 G01S13/00;(IPC1-7):G01S13/00 主分类号 G01S13/00
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