发明名称 |
METHOD FOR MEASURING ELEVATION USING GEOMETRIC CHARACTERISTIC OF INTERFEROMETRIC SYNTHETIC APERTURE RADAR |
摘要 |
PURPOSE: A method for measuring an elevation using a geometric characteristic of an interferometric synthetic aperture radar is provided to measure accurately an elevation by performing a phase difference-elevation conversion process. CONSTITUTION: An SAR image process for generating two-dimensional images is performed by receiving predetermined signals from each antenna by pixel unit having sizes and phases. The SAR images are arranged in a range/Doppler region and an interferometric phase difference is detected by pixel unit. An elevation is obtained by performing a phase difference-elevation conversion process and using a predetermined mathematical expression. A filtering for processing the calculated elevation information is performed by processing of one pixel or a spatial filtering process using a multi look method for dividing one region into multiple pixels.
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申请公布号 |
KR100425283(B1) |
申请公布日期 |
2004.03.18 |
申请号 |
KR20030024546 |
申请日期 |
2003.04.18 |
申请人 |
CHUNGCHEONG SURVEY & DESIGN. CO., LTD. |
发明人 |
LEE, JAE KWAN |
分类号 |
G01S13/00;(IPC1-7):G01S13/00 |
主分类号 |
G01S13/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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