| 摘要 |
PROBLEM TO BE SOLVED: To provide an IC tester capable of testing in a short time. SOLUTION: In this invention, the IC tester for testing a test object having a plurality of output pins is improved. This device is characterized by being provided with a selection part for selecting a test object output pin by a plurality of relays, at least one current source for sending a current to the output pin selected by the selection part, and a control part for controlling switching of the relay of the selection part and allowing the current source to send a current at the on-time of the relay. COPYRIGHT: (C)2004,JPO
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