发明名称 |
CONTACT PROBE, PROBE DEVICE AND METHOD FOR MANUFACTURING CONTACT PROBE |
摘要 |
PROBLEM TO BE SOLVED: To surely bring an electrode terminal of an object to be measured into contact with contact pins, without impairing connectivity of pattern wirings to a printed circuit board. SOLUTION: The contact pins 11 are respectively fixed to the tips 13a of the pattern wirings 13, by engaging recesses 11c formed at the pins with the tips 13a of the wirings 13, with which one surface of the film 12 is covered. The tips 11a of the pins 11 are arranged so as to be brought into substantially perpendicular contact with the electrode terminal of the object to be measured. COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2004085241(A) |
申请公布日期 |
2004.03.18 |
申请号 |
JP20020243520 |
申请日期 |
2002.08.23 |
申请人 |
MITSUBISHI MATERIALS CORP |
发明人 |
SUGIYAMA TATSUO;KATO NAOKI;MASUDA AKIHIRO |
分类号 |
G01R1/06;G01R1/073;H01L21/66;(IPC1-7):G01R1/06 |
主分类号 |
G01R1/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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