发明名称 METHOD FOR CHECKING AN INTEGRATED CIRCUIT FOR ELECTROSTATIC DISCHARGE ROBUSTNESS
摘要 The invention is a method and a computer program product for checking an integrated circuit for electrostatic discharge (ESD) robustness at the design level and comprises essentially the check of the layout of the integrated circuit against a set of rules defining one or more transistor geometric and/or electrical and/or material values and generating an output or report of this check. This method can check automatically a complete IC design layout at any design level. An exemplary design is an ESD protection layout, a design block or a complete IC design.
申请公布号 WO2004023350(A2) 申请公布日期 2004.03.18
申请号 WO2003IB03787 申请日期 2003.08.25
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V.;KEMPER, WOLFGANG;MRCARICA, ZELJKO;KELLER, THOMAS;THOMMEN, DANIEL;REINER, JOACHIM, CHRISTIAN 发明人 KEMPER, WOLFGANG;MRCARICA, ZELJKO;KELLER, THOMAS;THOMMEN, DANIEL;REINER, JOACHIM, CHRISTIAN
分类号 G06F17/50;H01L21/82;H01L21/822;H01L27/04 主分类号 G06F17/50
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