发明名称 METHOD AND SYSTEM FOR DRY ETCHING AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a dry etching method which enables dry etching at lower temperatures, and to provide a dry etching system. SOLUTION: This dry etching method comprises (a) a process for preparing an etching device 101a in which solid-state silicon sources 133a, 133b are arranged in a chamber 103, (b) a process for laying in a chamber 103 a substrate 137 consisting of one or a plurality of kinds of compound semiconductors 137b, and (c) a process for etching the compound semiconductors 137b using an etching gas 126X containing halogen elements to form a substrate 141 to be etched. This dry etching method etches the compound semiconductors 137b in an atmosphere 139 consisting of the etching gas 126X containing halogen elements, and at least any one among silicon ions, silicon radicals and Si compounds to form the substrate 141 to be etched. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004088062(A) 申请公布日期 2004.03.18
申请号 JP20030040229 申请日期 2003.02.18
申请人 SUMITOMO ELECTRIC IND LTD 发明人 MIYAZAKI TOMIHITO
分类号 H01L21/28;H01L21/3065;H01L21/3205;H01L21/331;H01L23/52;H01L29/737;(IPC1-7):H01L21/306;H01L21/320 主分类号 H01L21/28
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