发明名称 METHOD OF ACQUIRING PROCESS RESULT INTEGRATED PRIOR TO PROCESS TOOL TO BE PLACED
摘要 <p><P>PROBLEM TO BE SOLVED: To confirm and guarantee a process result integrated prior to the placement of a process tool as a change or a part of renewal of a semiconductor manufacturing factory. <P>SOLUTION: A complete semiconductor manufacturing supplemental matter of a process tool is subdivided into a short loop or a submodule. Later, they are combined into a complete loop. The combination of a submodule to a module which approaches a complete supplemental matter of the process tool is carried out in a mild method, and one or a plurality of subloops are first combined and evaluated. One or a plurality of additional subgroups are added to this combination, and each of these subgroups at the end is also formed by combining one or a plurality of (original) subgroups. This process is continued until the complete supplemental matter of a process device is formed and the complete process loop of a semiconductor device manufacturing factory is completed. <P>COPYRIGHT: (C)2004,JPO</p>
申请公布号 JP2004088106(A) 申请公布日期 2004.03.18
申请号 JP20030298125 申请日期 2003.08.22
申请人 CHARTERED SEMICONDUCTOR MFG LTD 发明人 SHU CHENG CHOR;HOON CHO NAM;KONG LEONG CHEE;BENYON PETER;CHAM JOHNNY;WONG GEORGE;EE NEOH SOON
分类号 G05B19/418;G06Q50/00;H01L21/00;H01L21/02;(IPC1-7):H01L21/02;G06F17/60 主分类号 G05B19/418
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