发明名称 |
Low frequency testing, leakage control, and burn-in control for high-performance digital circuits |
摘要 |
A technique is described to allow testing of high-speed digital circuits using lower speed testing equipment, to circuits to be placed into a sleep mode, and to allow burn-in testing of digital circuits with minimal overhead in terms of silicon area or performance.
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申请公布号 |
US2004051558(A1) |
申请公布日期 |
2004.03.18 |
申请号 |
US20020246377 |
申请日期 |
2002.09.17 |
申请人 |
KESHAVARZI ALI;CHATTERJEE BHASKAR P.;KRISHNAMURTHY RAM;SACHDEV MANOJ |
发明人 |
KESHAVARZI ALI;CHATTERJEE BHASKAR P.;KRISHNAMURTHY RAM;SACHDEV MANOJ |
分类号 |
G01R31/28;G01R31/30;G01R31/317;G01R31/3185;(IPC1-7):H03K19/00 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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