发明名称 |
Resist pattern thickening material, process for forming resist pattern, and process for manufacturing semiconductor device |
摘要 |
A resist pattern thickening material (1) contains resin, cross-linking agent and nitrogen compound. Independent claims are also included for: (a) manufacture of thickened resist pattern (10). The resist pattern thickening material is applied on surface of the resist pattern (3) formed on base layer (5), so that the surface of resist pattern is covered with thickening material to manufacture thickened resist pattern; and (b) manufacture of semiconductor device, which involves patterning base layer by etching. |
申请公布号 |
EP1398671(A1) |
申请公布日期 |
2004.03.17 |
申请号 |
EP20030017270 |
申请日期 |
2003.07.30 |
申请人 |
FUJITSU LIMITED |
发明人 |
KOZAWA, MIWA;NAMIKI, TAKAHISA;NOZAKI, KOJI;KON, JUNICHI |
分类号 |
G03F7/004;G03F7/00;G03F7/40;G11B5/17;G11B5/31;H01L21/027;H01L21/3065;H01L21/311;H01L21/3213;H01L21/8247;H01L27/105 |
主分类号 |
G03F7/004 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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