发明名称 Chemical vapor deposition process for fabricating layered superlattice materials
摘要 A first reactant gas is flowed into a CVD reaction chamber containing a heated integrated circuit substrate. The first reactant gas contains a first precursor compound or a plurality of first precursor compounds, and the first precursor compound or compounds decompose in the CVD reaction chamber to deposit a coating containing metal atoms on the heated integrated circuit substrate. The coating is treated by RTP. Thereafter, a second reactant gas is flowed into a CVD reaction chamber containing the heated substrate. The second reactant gas contains a second precursor compound or a plurality of second precursor compounds, which decompose in the CVD reaction chamber to deposit more metal atoms on the substrate. Heat for reaction and crystallization of the deposited metal atoms to form a thin film of layered superlattice material is provided by heating the substrate during CVD deposition, as well as by selected rapid thermal processing ("RTP") and furnace annealing steps.
申请公布号 US6706585(B2) 申请公布日期 2004.03.16
申请号 US20030405309 申请日期 2003.04.02
申请人 SYMETRIX CORPORATION;MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 UCHIYAMA KIYOSHI;SOLAYAPPAN NARAYAN;PAZ DE ARAUJO CARLOS A.
分类号 C23C16/455;C23C16/02;C23C16/40;C23C16/44;H01L21/316;H01L21/8246;H01L21/8247;H01L27/105;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 C23C16/455
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