发明名称 |
METHOD FOR FABRICATING FLASH MEMORY CELL DEVICE IN SEMICONDUCTOR |
摘要 |
PURPOSE: A method for fabricating a flash memory cell device in semiconductor is provided to improve program efficiency of a flash cell by increasing contact area between a floating gate and a control gate. CONSTITUTION: A flash tunnel oxide layer(30) for isolation is formed on a silicon substrate(10). Polysilicon to be used as a floating gate(40) is deposited on the flash tunnel oxide layer. A buffer oxide layer is deposited on the floating gate and is pattern-etched to strip photoresist. After the polysilicon on a planar nitride layer is eliminated, an uneven floating gate is formed. An ONO layer(70) is deposited on the floating gate, and polysilicon to be used as a control gate(80) is deposited. A source/drain implant process is performed to form a source/drain(20). The control gate is patterned and etched to form a stacked flash cell.
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申请公布号 |
KR20040022490(A) |
申请公布日期 |
2004.03.16 |
申请号 |
KR20020054017 |
申请日期 |
2002.09.07 |
申请人 |
ANAM SEMICONDUCTOR., LTD. |
发明人 |
SEO, YEONG HUN |
分类号 |
H01L27/115;(IPC1-7):H01L27/115 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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