发明名称 |
Manufacturing of capacitors with metal armatures |
摘要 |
A method for forming a capacitor with metal armatures in metallization levels above an integrated circuit, including the steps of: depositing over the surface of an integrated circuit an insulating layer having a thickness ranging between 0.5 and 1.5 mum; digging into the insulating layer to form trenches, of which at least a portion in top view is parallel and separate from one trench to the other; depositing and leveling a metallic material to form conductive lines in the trenches; locally removing the insulating layer to remove it at least from all the intervals separating two conductive lines; conformally depositing a dielectric; and depositing and etching a second metallic material to at least completely fill the intervals between lines.
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申请公布号 |
US6706589(B2) |
申请公布日期 |
2004.03.16 |
申请号 |
US20010932468 |
申请日期 |
2001.08.17 |
申请人 |
STMICROELECTRONICS S.A. |
发明人 |
ARNAL VINCENT;TORRES JOAQUIM |
分类号 |
H01L21/02;(IPC1-7):H01L21/824;H01L21/20 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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