Thermal switch containing preflight test feature and fault location detection

摘要

An integral resistance element combined with a snap-action thermal switch and coupled to an output thereof, the snap-action thermal switch being structured in a normally-open configuration. The resistance element and the snap-action thermal switch share one or more common terminals. The snap-action thermal switch is structured having a pair of terminals being mutually electrically isolated when the snap-action thermal switch structured in the normally open configuration, and the integral resistance element is electrically coupled to provide an output on the pair of electrically isolated terminals.