发明名称 |
TRANSISTOR OF SEMICONDUCTOR DEVICE AND FABRICATING METHOD THEREOF |
摘要 |
PURPOSE: A method for fabricating a transistor of a semiconductor device is provided to prevent a punch-through phenomenon by recessing the upper surface of a semiconductor substrate having a channel so that the lower surface of a gate oxide layer becomes lower than the upper surface of a junction region. CONSTITUTION: A shallow trench having a recessed upper surface is formed in a predetermined region of the semiconductor substrate(100). A gate pattern is formed on the shallow trench. An impurity region is formed in the semiconductor substrate in the periphery of the gate pattern. The semiconductor substrate under the gate pattern is lower than the upper surface of the impurity region.
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申请公布号 |
KR20040022565(A) |
申请公布日期 |
2004.03.16 |
申请号 |
KR20020054168 |
申请日期 |
2002.09.09 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
NOH, JAE YUN;PARK, HYEONG MU |
分类号 |
H01L21/8232;(IPC1-7):H01L21/823 |
主分类号 |
H01L21/8232 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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