| 摘要 |
PROBLEM TO BE SOLVED: To provide a method and a device for inspecting a connection state of a semiconductor element capable of accurately inspecting a connection state between a terminal of the semiconductor element and a circuit board as well as open and short determination, reducing load on the semiconductor element at an inspection time, and being realized in an inexpensive constitution. SOLUTION: An electrode terminal 8 of a mounted flexible wiring board FC of an LSI 6 is mounted to a clip type connector 2, a plurality of kinds of constant current signals having a constant upper limit voltage are fed into a gap between a terminal 9 of the LSI 6 and a ground pin G, and gradient dn of change of output voltage with respect to variation of input current is compared with a predetermined reference value, thereby determining right and wrong of the connection state. COPYRIGHT: (C)2004,JPO
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