发明名称 Method for making semiconductor device, semiconductor element composite, electro-optical apparatus, and electronic system
摘要 The invention provides a method of fabricating a semiconductor device in which a more satisfactory selective etching ratio is ensured when AlGaAs is used for a layer provided with a semiconductor element, and provides a semiconductor element composite, an electro-optical apparatus, and an electronic system, each including the semiconductor device fabricated by the method. A method of fabricating a semiconductor device includes: forming a functional layer provided with a semiconductor element on a substrate with a sacrificial layer therebetween; and detaching the functional layer from the substrate by etching the sacrificial layer. The sacrificial layer is composed of an N-type Al(x1)Ga(1-x1)As layer and the functional layer is composed of an Al(x2)Ga(1-x2)As semiconductor layer, where x1>x2. Using hydrochloric acid or hydrofluoric acid with a concentration of 0.01% to 5% by weight as an etchant, the sacrificial layer is etched while the sacrificial layer is being irradiated with light.
申请公布号 US2004048447(A1) 申请公布日期 2004.03.11
申请号 US20030601704 申请日期 2003.06.24
申请人 SEIKO EPSON CORPORATION 发明人 KONDO TAKAYUKI
分类号 H01L51/50;G09F9/00;G09F9/30;H01L21/02;H01L21/306;H01L21/762;H01L21/77;H01L21/84;H01L27/12;H01S5/02;H01S5/183;(IPC1-7):H01L21/30;H01L21/00;H01L21/46 主分类号 H01L51/50
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