发明名称 |
Thin film transistor device and method of manufacturing the same, thin film transistor substrate and display having the same |
摘要 |
The invention relates to a TFT device, a method of manufacturing the same, and a TFT substrate and a display having the same and provides a TFT device having good characteristics and high reliability, a method of manufacturing the same, and a TFT substrate and a display having the same. A metal thin film is formed on a gate insulation film. Patterning is performed to remove the metal thin film on a semiconductor layer to become source and drain regions of an n-type TFT. Phosphorous ions are implanted using the patterned metal thin film as a mask to form the source and drain regions. The patterned metal thin film is further patterned to form a gate electrode of the n-type TFT. Phosphorous ions are implanted using the gate electrode as a mask to form LDD regions between the source and drain regions and a channel region.
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申请公布号 |
US2004048422(A1) |
申请公布日期 |
2004.03.11 |
申请号 |
US20030612414 |
申请日期 |
2003.07.02 |
申请人 |
FUJITSU DISPLAY TECHNOLOGIES CORPORATION |
发明人 |
KUROSAWA YOSHIO;HOTTA KAZUSHIGE |
分类号 |
G02F1/1368;G02F1/136;H01L21/336;H01L21/77;H01L21/8238;H01L21/84;H01L27/08;H01L27/092;H01L27/12;H01L29/786;(IPC1-7):H01L21/84;H01L21/00;H01L21/338 |
主分类号 |
G02F1/1368 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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