发明名称 PROBE FOR TESTING SECONDARY BATTERY
摘要 PURPOSE: A probe for testing a secondary battery is provided to improve a contact error between the probe and an electrode terminal due to a trouble of a tray by using a battery induction member to guide a position of the secondary battery in a test process. CONSTITUTION: A probe for testing a secondary battery includes an external plunger(120), an internal plunger(110), the first contact part(130), the second contact part(140), and a battery induction member(150). The external plunger(120) has a cylindrical shape. The internal plunger(110) is installed in the inside of the external plunger. The internal plunger is moved by the elastic force. The first contact part(130) is fixed to a bottom part of the internal plunger. The second contact part(140) is fixed to an outer circumference of a bottom part of the external plunger. The battery induction member(150) is used for covering the first and the second contact parts.
申请公布号 KR20040022004(A) 申请公布日期 2004.03.11
申请号 KR20020053808 申请日期 2002.09.06
申请人 SAMSUNG SDI CO., LTD. 发明人 KWON, YEONG GYU
分类号 G01R1/067;(IPC1-7):G01R1/067 主分类号 G01R1/067
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