发明名称 |
Methods for sampling and testing data centers for metallic particulates |
摘要 |
The present invention is drawn to methods for sampling and/or testing for the presence of whisker-like metallic particulates in data centers or computer rooms. For example, a method for discovering the presence of an undesired whisker-like metallic particulate in a data center is disclosed comprising providing a tool having a conductive adhesive portion wherein the conductive adhesive portion is capable of capturing and retaining the whisker-like metallic particulates in their fragile condition, locating a surface of the data center where metallic particulates may be present, extracting from the surface any whisker-like metallic particulates present in substantially their fragile condition using the tool, and confirming with an electron microscope whether or not any whisker-like metallic particulates are present on the conductive adhesive portion of the tool.
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申请公布号 |
US2004045377(A1) |
申请公布日期 |
2004.03.11 |
申请号 |
US20030658510 |
申请日期 |
2003.09.08 |
申请人 |
CARBONE RALPH A.;ROCHE DAVID J. |
发明人 |
CARBONE RALPH A.;ROCHE DAVID J. |
分类号 |
G01N1/08;(IPC1-7):G01N1/08 |
主分类号 |
G01N1/08 |
代理机构 |
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