发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE INCLUDING SILICON OXIDE LAYER |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device including a silicon oxide layer whereby it is possible to prevent the occurrence of a silicon coating and particles in a reaction chamber, prevent metal silicidation, and prevent a metal layer from being oxidized. <P>SOLUTION: The method comprises the step of loading a semiconductor substrate into the reaction chamber for performing deposition, the step of charging nitrogen atmosphere gas which contains a nitrogen element decomposable at low temperature into the reaction chamber to generate a nitrogen atmosphere in the reaction chamber, and the step of charging silicon source gas and oxygen source gas into the reaction chamber to deposit a silicon oxide layer on the semiconductor layer. <P>COPYRIGHT: (C)2004,JPO |
申请公布号 |
JP2004080011(A) |
申请公布日期 |
2004.03.11 |
申请号 |
JP20030194052 |
申请日期 |
2003.07.09 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
GU JIKIN;LEE CHANG-WON;HEO SEONG-JUN;SUN MIN-CHUL;YOUN SUN-PIL |
分类号 |
H01L21/28;H01L21/316;H01L21/336;H01L21/768;H01L21/8242;H01L21/8247;H01L23/522;H01L27/108;H01L27/115;H01L29/423;H01L29/49;H01L29/78 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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