发明名称 SEMICONDUCTOR DEVICE AND ITS FABRICATING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To obtain a semiconductor device capable of increasing capacity of a capacitor. <P>SOLUTION: There is provided the semiconductor device equipped with a first interlayer insulating film 3 formed on a semiconductor substrate 1, a lower electrode contact plug 5 formed by penetrating the first interlayer insulating film 3, a second interlayer insulating film 6 formed on the first interlayer insulating film 3, and a capacitor section 43 comprising a lower electrode formed in an opening 41 penetrating the second interlayer insulating film 6 to reach the lower electrode contact plug 5, a dielectric film, and an upper electrode. Further, an auxiliary insulative protrusion 42 is provided in part of an upper portion of the lower electrode contact plug 5, and further the capacitor section 43 is formed along an upper portion of the auxiliary insulative protrusion 42 inside the capacitor opening 41. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004079817(A) 申请公布日期 2004.03.11
申请号 JP20020238772 申请日期 2002.08.20
申请人 RENESAS TECHNOLOGY CORP;RENESAS SEMICONDUCTOR ENGINEERING CORP 发明人 ITO KOJI;SOEDA SHINYA
分类号 H01L21/8242;H01L27/108 主分类号 H01L21/8242
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