发明名称 |
Method of planarization of semiconductor devices |
摘要 |
A method of planarizing a semiconductor device includes the steps of providing a semiconductor substrate, forming a semiconductor component over the semiconductor substrate, depositing a doped silicate glass layer over the semiconductor component using a high density plasma chemical vapor deposition, the doped silicate glass layer forming a protrusion directly over the semiconductor component, and planarizing the doped silicate glass layer by a chemical mechanical polishing process to remove the protrusion.
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申请公布号 |
US2004048480(A1) |
申请公布日期 |
2004.03.11 |
申请号 |
US20020237798 |
申请日期 |
2002.09.10 |
申请人 |
TING SHAO-YU;LIANG JACK;WANG CHIH-FAN |
发明人 |
TING SHAO-YU;LIANG JACK;WANG CHIH-FAN |
分类号 |
H01L21/3105;H01L21/768;(IPC1-7):H01L21/302 |
主分类号 |
H01L21/3105 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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