发明名称 Wafer holding
摘要 The invention provides a wafer holding apparatus which enables ascertainment of gripping and presence/absence of a wafer through use of single detection means. The apparatus has drive means (2) having a pressing element (8) which advances or recedes in a longitudinal direction; and detection means (9) for detecting advancement/receding of the pressing element (8). When the detection means (9) has detected that the pressing element (8) has advanced to and come to a halt at a predetermined position, the wafer is determined to be properly held. When the detection means (9) has detected that the pressing element (8) has advanced in excess of the predetermined position, the wafer is determined not to be present on the wafer holding apparatus.
申请公布号 US2004048474(A1) 申请公布日期 2004.03.11
申请号 US20030450654 申请日期 2003.06.16
申请人 ASANO HIROSHI 发明人 ASANO HIROSHI
分类号 B25J15/08;B65G49/07;H01L21/00;H01L21/677;H01L21/68;H01L21/687;(IPC1-7):H01L21/302;H01L21/461 主分类号 B25J15/08
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