发明名称 CHARGED PARTICLE MANIPULATION
摘要 Methods and apparatus are provided for manipulating the phase space of at least one charged particle, wherein a combination of alternating current and direct current voltages applied to an electrode forms a potential which provides a region of phase space manipulation, and wherein the at least one charged particle is situated to one side of the electrode surface. A number of applications are applicable, which include a spot trap, a conveyor belt, a funnel, and ways of holding different types of particles at different distances from an array so that they can be manipulated.
申请公布号 WO2004021385(A2) 申请公布日期 2004.03.11
申请号 WO2003GB03683 申请日期 2003.08.22
申请人 THE QUEEN'S UNIVERSITY OF BELFAST;CURRELL, FREDERICK, JOHN 发明人 CURRELL, FREDERICK, JOHN
分类号 G21K1/00;H01J;H01J9/34;H01J49/00;H01J49/40;H01J49/42 主分类号 G21K1/00
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