发明名称 |
Semiconductor component test system and process has individual characterization number for each semiconductor element for electronic testing and fewer test channels |
摘要 |
An arrangement, especially a wafer (2), comprises many testable semiconductor components each of which has an individually recognizable element, especially an identification number, for carrying out tests. Independent claims are also included for the following: (a) a semiconductor test system for the above;and (b) a test process as above
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申请公布号 |
DE10241141(A1) |
申请公布日期 |
2004.03.11 |
申请号 |
DE2002141141 |
申请日期 |
2002.09.05 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
FERREIRA, JESUS;KALLSCHEUER, JOCHEN |
分类号 |
H01L23/544;(IPC1-7):H01L21/66 |
主分类号 |
H01L23/544 |
代理机构 |
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地址 |
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