发明名称 SYSTEM AND METHOD FOR CAPACITIVE MEASURING
摘要 <p>The invention concerns a system (S') for non-contact measurement of a relative displacement or relative position of a first object relative to a second object, comprising: a sensor module (1) including a transmitter plate fixed to the first object and a receiver plate connected to the second object, arranged substantially facing each other and provided with respectively transmitting and receiving electrodes; and an electronic module (500) designed to apply on the transmitting electrodes high-frequency excitation signals, and to process measurement signals derived from the receiving electrodes. The transmitting and receiving electrodes are designed to constitute a first variable capacitance based on the relative misalignment of said plates. The electronic module (500) is designed to perform an analog calculation (i) of a first signal representing the inverted capacitance and (ii) of a second signal representing the ratio of the second capacitance over the first capacitance. The invention is in particular useful for controlling segmented mirrors in large telescopes.</p>
申请公布号 WO2004020953(A1) 申请公布日期 2004.03.11
申请号 WO2003FR02587 申请日期 2003.08.27
申请人 ROZIERE, DIDIER;NANOTEC SOLUTION 发明人 ROZIERE, DIDIER
分类号 G01D5/241;(IPC1-7):G01D5/241 主分类号 G01D5/241
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