发明名称 APPARATUS AND METHOD FOR INSPECTING DEFECT OF DISC
摘要 PURPOSE: An apparatus and a method for inspecting a defect of a disc are provided to quantitatively show a defect in a disc, which is not recognized by the naked eye. CONSTITUTION: An apparatus for inspecting a defect in a disc includes a detector(320), a comparator(340), a counter(350), and an interface(360). The detector detects a top envelope value from a signal read from the disc. The comparator compares the detected top envelope value with a reference value. The counter counts the number of top envelope values that are lower than the reference value. The interface transmits the counted number of top envelope values. The apparatus further includes an output unit that outputs the transmitted number of top envelope values.
申请公布号 KR20040021805(A) 申请公布日期 2004.03.11
申请号 KR20020053159 申请日期 2002.09.04
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 WOO, JAE HYEON
分类号 G11B20/00;(IPC1-7):G11B20/00 主分类号 G11B20/00
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