| 摘要 |
PROBLEM TO BE SOLVED: To provide a multibeam scanner which can always obtain an uniform beam pitch between image heights with a simple configuration and which permits the easy regulation thereof without being affected by a temperature distribution in the apparatus even if the temperature distribution is uneven. SOLUTION: The multibeam scanner is provided with a light source unit 1 having a plurality of light sources 2a and 2b, a deflector 5 for deflection scanning of the luminous fluxes from a plurality of the light sources of the light source unit to a horizontal scanning direction and an optical system for exposure scanning of a surface 10a to be scanned by condensing the luminous fluxes subjected to deflection scanning by the deflector by an optical element 6 having power in the horizontal scanning direction and an optical element 7 having power in a vertical scanning direction so as to obtain a prescribed beam spot diameter and by returning back the luminous fluxes in the optical paths by a reflective mirror 8. One of the optical elements 6 and 7 is provided with regulating means 9a and 9b capable of makingαeccentricity around the center of optical axes with respect to an optical axis direction within the plane formed by the scanning lines to be subjected to deflection scanning by the deflector. COPYRIGHT: (C)2004,JPO |
