| 摘要 |
PROBLEM TO BE SOLVED: To provide a characteristic measuring device capable of certainly cleaning dirt of a spherical measuring terminal contacting with an external electrode of a chip-type electronic component and measuring an electric characteristic of the chip-type electronic component always without error. SOLUTION: The device contacts with the external electrode 66 of a chip-type capacitor 65 intermittently conveyed to a measuring position B and measures the electric characteristic. The device has a measuring unit 10 where the spherical measuring terminal 11 is rotatably held at the tip of a holder 15, and the holder 15 is vertically movably mounted to a supporting member 20. A through hole is disposed in an axial center of the holder 15, and gas such as compressed air is jetted to the measuring terminal 11 through the through hole to clean the surface of the measuring terminal 11. COPYRIGHT: (C)2004,JPO
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