发明名称 Head suspension for a disk device, disk device and head IC testing method
摘要 This invention relates to a head suspension with a head IC and makes it possible to simplify checking of the head IC and reduce the cost of the head suspension. A first connection terminal 21 that electrically connects to the head 4; a second connection terminal 22 that connects to external circuits; third and fourth connection terminals 23, 24 that electrically connect to the head IC 20, which processes the electrical signal from the head; a first conductive path 28 that connects the first connection terminal 21 with the third connection terminal 23; a second conductive path 26 that connects the second connection terminal 22 with the fourth connection terminal 24; and a measurement terminal 25 that is located between the second connection terminal 22 and fourth connection terminal 24 are formed on the head suspension 9. With this invention, contact of the probes for checking the head IC when the head IC has been installed before installing the head becomes easier.
申请公布号 US2004047276(A1) 申请公布日期 2004.03.11
申请号 US20030659624 申请日期 2003.09.10
申请人 FUJITSU LIMITED 发明人 GOUO AKIO
分类号 G11B5/60;G11B5/00;G11B5/455;G11B5/48;G11B21/21;G11B33/12;(IPC1-7):G11B3/00 主分类号 G11B5/60
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