| 摘要 |
The control unit 21 takes in a test command and expected value data from input terminals 11 and 12 respectively, to output via an internal bus 30 the command to the function block 31 etc. and the expected value data to a decision unit 40. A processing result of the function block 31 etc. is provided to the decision unit 40, where it is compared to the expected value data in order to decide acceptability of the function block 31 etc. The decision result is held in an output unit 50 and output from an output terminal 104 etc. Such a configuration provides a semiconductor integrated circuit which can easily adjust the timing in a test operation mode and reduce the number of external terminals.
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