发明名称 Method for manufacturing surface acoustic wave device and inspecting instrument
摘要 In a tester for a surface acoustic wave device used as a filter for high frequency bands in the field of mobile communications, the tester includes: an electron gun generating an electron beam to be first electrons; a condenser lens for converging the electron beam on a substrate; an electron beam scanning portion for scanning the electron beam on the substrate; a secondary electron detector detecting second electrons generating from the substrate by irradiated first electrons; a substrate holder holding the substrate; and a conductive grounding tool which can contact the metal film. The grounding tool includes a contacting head. The grounding tool includes: a contacting head that can contact the grounding tool and the metal film; an arm portion arranged at the end of the contacting head; a shaft arranged at the other end of the contacting head, and rotating the arm portion. The substrate has a two-layer structure, which includes: a circular piezo-electric substrate including lithium tantalate (LiTaO3); and a metal film including aluminum (Al) formed on the piezo-electric substrate.
申请公布号 US2004047982(A1) 申请公布日期 2004.03.11
申请号 US20030466546 申请日期 2003.07.24
申请人 TAKAGI TOSHIYUKI 发明人 TAKAGI TOSHIYUKI
分类号 H03H3/08;(IPC1-7):B05D5/12 主分类号 H03H3/08
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