发明名称 |
Method and apparatus for waiving noise violations |
摘要 |
The present invention describes a method and an apparatus for waiving noise violations during semiconductor integrated circuit design. The noise violations in a circuit area (e.g., an individual cell, block of cells or the like) are identified using a threshold look-up table. The threshold look-up table includes different thresholds for each circuit area. The threshold look-up table is generated using various cell related information including practical noise handling limits of each cell that can be higher than traditional noise limits. The information in the threshold look-up table helps eliminate benign noise violations and a new noise report is generated. The new noise report incorporates the practical noise handling capabilities of the cell under analysis and identifies actual noise violations in the semiconductor integrated circuit.
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申请公布号 |
US2004049745(A1) |
申请公布日期 |
2004.03.11 |
申请号 |
US20020236840 |
申请日期 |
2002.09.06 |
申请人 |
SUN MICROSYSTEMS, INC. |
发明人 |
RAHMAN MOHAMMED M.;YANG LANGYA;ZHANG YONGJUN;LEUNG VICTOR C.;LU HUI;XU SHUNJIANG;PYAPALI RAMBABU;LAI PETER F.;WU CHIN-CHANG G. |
分类号 |
G06F17/50;(IPC1-7):G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
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