发明名称 Non-volatile semiconductor memory device and rewriting method
摘要 <p>A non-volatile semiconductor memory device is provided, which comprises a memory array comprising memory cells, in which each memory cell is capable of storing data values depending on the voltages thereof, the data values include a first data value corresponding to a first voltage range and a second data value corresponding to a second voltage range, and the first data is written in a memory cell of the memory cells, a determination section for determining whether a voltage value of the memory cell is higher or lower than a reference value set between a maximum value and a minimum value of the first voltage range, and a rewrite section for rewriting the first data into the memory cell based on a determination result of the determination section so that a margin between the first voltage range and the second voltage range in the memory cell is enlarged. &lt;IMAGE&gt;</p>
申请公布号 EP1396862(A1) 申请公布日期 2004.03.10
申请号 EP20030020113 申请日期 2003.09.04
申请人 SHARP KABUSHIKI KAISHA 发明人 TANAKA, HIDEHIKO
分类号 G11C16/02;G11C11/56;G11C16/12;G11C16/34;(IPC1-7):G11C11/56 主分类号 G11C16/02
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