发明名称 METHOD FOR FORMING CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a capacitor of a semiconductor device is provided to enhance capacitance and to improve leakage current by using a dielectric film including an YON layer and an Al2O3 layer. CONSTITUTION: An interlayer dielectric(3) with a contact plug(6) is formed on a semiconductor substrate(1). A lower electrode(10) is formed to contact the contact plug. The surface of the lower electrode is treated by nitridation. A dielectric film(11) is formed by forming sequentially an YON layer(11a) and an Al2O3 layer(11b) on the lower electrode. Then, an upper electrode is formed on the dielectric film.
申请公布号 KR20040020243(A) 申请公布日期 2004.03.09
申请号 KR20020051777 申请日期 2002.08.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 AHN, BYEONG GWON;PARK, SEONG HUN
分类号 H01L27/04;(IPC1-7):H01L27/04 主分类号 H01L27/04
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