发明名称 |
METHOD FOR FORMING CAPACITOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming a capacitor of a semiconductor device is provided to enhance capacitance and to improve leakage current by using a dielectric film including an YON layer and an Al2O3 layer. CONSTITUTION: An interlayer dielectric(3) with a contact plug(6) is formed on a semiconductor substrate(1). A lower electrode(10) is formed to contact the contact plug. The surface of the lower electrode is treated by nitridation. A dielectric film(11) is formed by forming sequentially an YON layer(11a) and an Al2O3 layer(11b) on the lower electrode. Then, an upper electrode is formed on the dielectric film.
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申请公布号 |
KR20040020243(A) |
申请公布日期 |
2004.03.09 |
申请号 |
KR20020051777 |
申请日期 |
2002.08.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
AHN, BYEONG GWON;PARK, SEONG HUN |
分类号 |
H01L27/04;(IPC1-7):H01L27/04 |
主分类号 |
H01L27/04 |
代理机构 |
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地址 |
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