SEMICONDUCTOR TEST SYSTEM AND METHOD FOR TESTING THE SAME

摘要

PURPOSE: A semiconductor test system and a method for testing the same are provided to test a number of semiconductor chips simultaneously without limiting the number of data input and output pins. CONSTITUTION: A semiconductor test system includes a tester(20), a plurality of semiconductor chips(24-11 - 24-nm) and a control block(22). The tester(20) is provided with a plurality of data input and output pins, inputs and outputs data through the plurality of data input and output pins. The plurality of semiconductor chips(24-11¯24-nm) is tested by the tester(20). The control block(22) outputs the data outputted from the plurality of the semiconductor chips(24-11¯24-nm) to the tester(20), subsequently, during the read operation. And, the control block(22) applies the data inputted from the tester(20) to the plurality of chips, simultaneously, during the write operation.