Electronic pulse characteristics evaluation circuit for natural radiation effect assessment has chain of integrated circuits with outputs connected through memory flip flops to analysis circuit

摘要

An electronic pulse characteristics evaluation circuit has a chain of integrated circuits (D1-n) with outputs connected through clocked (CLK) memory (B1-n) measurement circuit to an analysis circuit (1) counting the number of outputs reset. Includes Independent claims for multiplexer and group connection of the flip flops and for measurement of integrated circuit non conducting transistor or source drain currents by common length connection to a common node and analogue flip flops memorising the amplifier output voltage.