发明名称 METHOD AND DEVICE FOR INSPECTING STORAGE DISK DEVICE
摘要 PROBLEM TO BE SOLVED: To provide stable quality by predicting the number of read errors of a sync byte (SB) caused by very small defects even without testing based on a data block length for each user regarding a method for inspecting a storage disk device. SOLUTION: A writing/reading section 11 executes full-surface writing/reading based on ECC correction inhibition. A defective byte position detection section 12 obtains the position information of a read error occurrence position as the byte-from index (BFI) information of a defective byte, and stores the information in a defective byte position information storage section 13. A synch byte position calculation section 14 calculates the position information in the case of formatting based on a data block length expected to be used by a user as BFI information. A position information comparison section 15 compares the BFI information of a defective byte position with the BFI information of the position of each SB to obtain a coincident number. A nondefective/defective product determination section 16 determines a nondefective/defective product based on the coincident number. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004071061(A) 申请公布日期 2004.03.04
申请号 JP20020229408 申请日期 2002.08.07
申请人 FUJITSU LTD 发明人 WATANABE HIDEYUKI
分类号 G11B5/09;G11B20/10;G11B20/18;(IPC1-7):G11B20/18 主分类号 G11B5/09
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