发明名称 METHOD FOR PROCESSING DATA BASED ON THE DATA CONTEXT
摘要 <p>A method for managing collected data in a semiconductor processing environment. The collected data can include: raw data collected during a process, trace file data received during a process, and process log file data received during a process. The raw data is synchronized with the trace file data and process log file data to create wafer data and summary data, and a file is created containing the wafer data and the summary data.</p>
申请公布号 WO2004019147(A2) 申请公布日期 2004.03.04
申请号 WO2003US25479 申请日期 2003.08.14
申请人 TOKYO ELECTRON LIMITED;FUNK, MERRITT 发明人 FUNK, MERRITT
分类号 H01L21/02;G05B15/02;G05B19/418;G05B23/02;G06F17/30;(IPC1-7):G05B19/418 主分类号 H01L21/02
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