发明名称 Combinational equivalence checking methods and systems with internal don't cares
摘要 An equivalence checking method provides first and second logic functions. Don't care gates are inserted for don't care conditions in the first and second logic functions. The insertion of the don't care gates creates a first intermediate circuit and a second intermediate circuit. All 3DC gates of the first intermediate circuit are propagated and merged into a single 3DC gate when 3DC gates and SDC gates coexist in either of the first and second intermediate circuits. All 3DC gates of the second intermediate circuit are propagated and merged into a single 3DC gate when 3DC gates and SDC gates coexist in either of the first and second intermediate circuits. First and second circuit are produced in response to propagating and merging the 3DC gates. A combinational equivalence check is then performed of the first circuit to the second circuit under different equivalence relations.
申请公布号 US2004044975(A1) 申请公布日期 2004.03.04
申请号 US20020230976 申请日期 2002.08.28
申请人 LAI YUNG-TE;CHANG CHIOUMIN;CHEN KUNG-CHIEN;LIN CHIH-CHANG 发明人 LAI YUNG-TE;CHANG CHIOUMIN;CHEN KUNG-CHIEN;LIN CHIH-CHANG
分类号 G06F17/50;(IPC1-7):G06F17/50 主分类号 G06F17/50
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