发明名称 GROUP III NITRIDE SEMICONDUCTOR ELEMENT, MANUFACTURING METHOD THEREOF AND GROUP III NITRIDE SEMICONDUCTOR SUBSTRATE
摘要 <P>PROBLEM TO BE SOLVED: To realize a group III nitride semiconductor element equipped with an electrode, hardly separated and low in resistance, on the surface (000-1) of a group III nitride semiconductor substrate. <P>SOLUTION: A projection 113 has a facets surface in which the surface of the crystal except the surface (000-1) is exposed. The projection 113 is provided on the surface (000-1) of an n-type GaN substrate 101 through etching. Thereafter, Ti and Al are evaporated on the surface (000-1) of the substrate 101 and heat treatment is effected. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004071657(A) 申请公布日期 2004.03.04
申请号 JP20020225342 申请日期 2002.08.01
申请人 NEC CORP 发明人 YAMAGUCHI ATSUSHI
分类号 H01L21/28;H01L21/20;H01L21/3065;H01L21/308;H01L29/04;H01L29/20;H01L29/41;H01L33/20;H01L33/32;H01L33/36;H01S5/02;H01S5/042;H01S5/323;H01S5/343 主分类号 H01L21/28
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