THE LAMINATE STRUCTURES AND METHOD FOR THE ELECTRICAL TESTING THEREOF

摘要

A method for testing for defects in a thin-laminate structure suitable for use in a number of different applications, including the manufacture of capacitive PCBs, is provided in which the testing is conducted on the thin-laminate sheet immediately after lamination but prior to formation of multiple panels from the sheet. The invention includes a thin-laminate sheet that is constructed so that the two conductive layers are electrically isolated from one another along the peripheral edges of the sheet.