发明名称 ATOMIC LAYER DEPOSITION OF CMOS GATES
摘要 <p>Structures, systems and methods for transistors having gates with variable work functions formed by atomic layer deposition are provided. One transistor embodiment includes a first source/drain region, a second source/drain region, and a channel region therebetween. A gate is separated from the channel region by a gate insulator. The gate includes a ternary metallic conductor formed by atomic layer deposition to provide the ternary metal conductor with a composition engineered to provide a desired thereshold voltage.</p>
申请公布号 WO2004019394(A1) 申请公布日期 2004.03.04
申请号 WO2003US26487 申请日期 2003.08.21
申请人 MICRON TECHNOLOGY, INC.;FORBES, LEONARD;AHN, KIE, Y. 发明人 FORBES, LEONARD;AHN, KIE, Y.
分类号 H01L21/28;H01L21/285;H01L21/8238;H01L27/092;H01L27/10;H01L29/423;H01L29/49;H01L29/78;(IPC1-7):H01L21/28;H01L21/823 主分类号 H01L21/28
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